Scale bar, 100 nm. (j) TEM DF image formed by using the g=113 twin reflection. Scale bar, 100 nm. Full size image. Deformation by twinning in tension.

The JEM-F200 “F2” Multipurpose Analytical S/TEM has a Cold Field Emission Gun and twin Silicon Drift Detectors, making it the only advanced analytical, high throughput 200kV S/TEM in its class. The ...

b,c, Dark-field TEM images and electron diffraction pattern (inset) of typical 160- and 110-nm-diameter pillars with orthogonal twin boundaries, respectively. Images were taken from the [011] zone ...

Featuring the standard X-Twin pole piece gap, which offers unparalleled flexibility in applications, and a consistently reliable electron column, the microscope creates possibilities for ...