News

EDN3h
System-level test’s expanding role in producing complex chips
System-level test (SLT) has evolved into a necessary test insertion for high-performance processors and chiplets.
Power Electronics World16h
Rohm develops compact MOSFET for fast charging
Rohm has developed a 30V N-channel MOSFET in a common-source configuration that achieves an industry-leading ON-resistance of ...
presseagentur.com22h
ROHM Develops an Ultra-Compact MOSFET Featuring Industry-Leading* Low ON-Resistance Ideal for Fast Charging Applications
AW2K21 — in a common-source configuration that achieves an industry-leading ON-resistance of 2.0milliohm (typ.) in a compact ...