News

IEEE20h
Charge Trap Layer Supercharging for Improved Bit Reliability in 3-D NAND Flash Under Proton Irradiation - IEEE Xplore
Single-event upset (SEU) cross sections are reduced in 176-layer charge trap (CT) 3-D nand devices under proton irradiation when multiple write operations are applied sequentially without the typical ...
IEEE3d
A Physics-Based Model of Charge Trapping Behavior of Si FeFET With Metal/Ferroelectric/Interlayer/Si Structure - IEEE Xplore
Based on our model, we find that the charge trapping behavior is mainly determined by DT at the high electric field and by inelastic TAT at the low electric field. We evaluate the typical time of ...
C&EN3d
Electron Flow Characterization of Charge Transfer for Carbonic Acid to Strong Base Proton Transfer in Aqueous Solution | The Journal of Physical Chemistry B - ACS Publications
Protonation of the strong base methylamine CH3NH2 by carbonic acid H2CO3 in aqueous solution, HOCOOH···NH2CH3 → HOCOO–···+HNH2CH3, has been previously studied ( J. Phys. Chem. B 2016, 109, 2271−2280; ...
IFLScience on MSN4d
"Uncharted Waters": Large Hadron Collider Begins Colliding Oxygen For The First Time
The Large Hadron Collider (LHC) has begun its first-ever collisions of oxygen ions, in the latest attempt to understand the ...