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IEEE5h
Heavy-ion and proton Single Event Effect (SEE) characterization of 7nm FinFET AMD Versal TM - IEEE Xplore
This paper presents the test setup and SEE results recently obtained under heavy ions and protons on 7nm FinFET Xilinx Versal™, the latest product proposed by Xilinx. Single Event Upset (SEU) ...
IEEE10h
Evaluation of Fin Geometry and Threshold Voltage Variants on Single-Event Effects in 7-, 5-, and 3-nm Bulk FinFET Technologies - IEEE Xplore
Technology computer-aided design (TCAD) simulations are used to clarify the underlying mechanisms affecting single-event upset (SEU) results at 7-, 5-, and 3-nm bulk FinFET technologies using ...
Electronics3602d
Major challenges in chiplet-based designs
Challenges include probing fine-pitch micro-bumps and maintaining test access throughout 3D stacks. Solutions include ...