We developed 1.1-mum-range oxide-implant VCSELs with InGaAs/GaAsP strain-compensated MQWs. 25 Gbit/s-100degC error-free operation and high reliability over 3000 hours under 150degC operation were ...

In the wake of the largest series of U.S. tariff hikes since 1930, a new study from Michigan State University explores how this economic shock is reshaping global supply chains and offers a framework ...

Board-level drop reliability test and analysis requires dynamic characterization of high strain-rate properties of bulk solder and solder joint failure tests. Drop impact analysis of board-level ...