Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force ...

Atomic force microscopy (AFM) is a highly useful instrument for material inspection, capable of scanning conductive and nonconductive samples without any restrictions as to the environment in which it ...

The power semiconductor devices are progressing toward high-withstand voltage using wide bandgap semiconductor materials, and multi-parallel integration by microfabrication technique. We succeeded in ...