Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force ...

Atomic force microscopy (AFM) is a highly useful instrument for material inspection, capable of scanning conductive and nonconductive samples without any restrictions as to the environment in which it ...

Here we use a combination of noncontact atomic force microscopy (AFM) and density functional theory (DFT) to resolve O 2 adsorption on the rutile T i O 2 (110) surface, which presents a longstanding ...

In this study, we used scanning tunneling microscopy (STM) and atomic force microscopy (AFM) simultaneously to compare the atomic structures of defects with their electronic structures. We identified ...

Regulated cell death (RCD) is pivotal in developmental biology, disease pathology, target identification, and drug discovery. Existing RCD detection methods, reliant on biomarkers and fluorescent ...

Atomic Force Microscopy plays a crucial role in semiconductor failure analysis, addressing challenges in defect inspection and improving manufacturing quality.

This article presents a novel harmonic atomic force microscopy with tip-sample couplings (TS-HAFM) working in force modulation mode for imaging samples of different mechanical properties. Compared ...