Technology computer-aided design (TCAD) simulations are used to clarify the underlying mechanisms affecting single-event upset (SEU) results at 7-, 5-, and 3-nm bulk FinFET technologies using ...

Samsung Electronics is recalibrating its semiconductor foundry roadmap, putting the spotlight squarely on refining its 2 nm ...

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Challenges include probing fine-pitch micro-bumps and maintaining test access throughout 3D stacks. Solutions include ...

IEEE is built on the strength of its members and their volunteer efforts throughout the organization. Most IEEE programs require member involvement to facilitate the planning and execution of projects ...

Static Random Access Memory (SRAM) is a critical component in modern micro-architectures, playing a pivotal role in Application-Specific Integrated Circuits (ASICs) and Systems on Chip (SoCs). This ...

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