This paper presents the results of DDR3 SDRAM stuck/weak bit studies from HI, TID, Neutron, Proton and temperature tests. The objectives include identifying reasonable engineering solutions to either ...

The Elpida EDS5104(08)ABTA 512Mb SDRAM is examined for programmatic impact of SEE. Use cases for the devices including EDAC and mode register reload are examined. Results indicate some SEE mitigation ...