Despite recent advances in structural test methods, the diagnosis of the root cause of board-level failures for functional tests remains a major challenge. A promising approach to address this problem ...

Failure theories are used to predict when a material will fail due to static loading. They do this by comparing the stress state at a point with material properties that can be easily determined from ...

Figure 17 illustrates the experimental fatigue lives according to the observed fatigue failures, the number of repetitions of fatigue tests carried out under identical conditions, the scatter of the ...

The die-attach layer is a vulnerable structure that is important to the reliability of an insulated-gate bipolar transistor (IGBT) module. A new failure mechanism named fatigue crack network (FCN) has ...