Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force microscope, then we look at a real AFM (an nGauge AFM from ICSPI) and do a few ...

A research team led by Prof. Tian-Bao Ma from the Department of Mechanical Engineering at Tsinghua University has proposed a ...

New research led by the University of Liverpool in collaboration with the University of New South Wales (Sydney, Australia) ...

Atomic force microscopy (AFM) is a highly useful instrument for material inspection, capable of scanning conductive and nonconductive samples without any restrictions as to the environment in which it ...

The power semiconductor devices are progressing toward high-withstand voltage using wide bandgap semiconductor materials, and multi-parallel integration by microfabrication technique. We succeeded in ...