Today we're looking at Atomic Force Microscopy! I built a "macro-AFM" to demonstrate the principles of an atomic force microscope, then we look at a real AFM (an nGauge AFM from ICSPI) and do a few ...

A research team led by Prof. Tian-Bao Ma from the Department of Mechanical Engineering at Tsinghua University has proposed a ...

New research led by the University of Liverpool in collaboration with the University of New South Wales (Sydney, Australia) ...

Atomic force microscopy (AFM) is a highly useful instrument for material inspection, capable of scanning conductive and nonconductive samples without any restrictions as to the environment in which it ...

Interaction of molecular oxygen with semiconducting oxide surfaces plays a key role in many technologies. The topic is difficult to approach both by experiment and in theory, mainly due to multiple ...

Nitrogen (N)-doped graphene is a promising candidate for semiconducting devices and catalysts or sensor applications due to its controllable properties depending on the atomic structure of nitrogen ...

Regulated cell death (RCD) is pivotal in developmental biology, disease pathology, target identification, and drug discovery. Existing RCD detection methods, reliant on biomarkers and fluorescent ...

This article will explore various aspects of failure analysis methodologies in semiconductor and electronic device manufacturing, with a particular focus on the application of atomic force microscopy ...

This article presents a novel harmonic atomic force microscopy with tip-sample couplings (TS-HAFM) working in force modulation mode for imaging samples of different mechanical properties. Compared ...