STEM Microscope - Spectra 300 TEM | Thermo Fisher Scientific
The Spectra 300 (S)TEM, with X-FEG/Mono or X-FEG/UltiMono, offers STEM resolution specifications of 50 pm at 300 kV, 96 pm at 60 kV and 125 pm at 30 kV with 30 pA of probe current or 100 pA with the X-CFEG.
The Spectra 300 (S)TEM is the highest resolution imaging and spectroscopic platform from Thermo Fisher Scientific. Wth its wide-gap pole piece and an accelerating voltage range of 30–300 kV, it serves an expansive range of materials investigations.
Spectra Ultra STEM - Thermo Fisher Scientific - US
Highest resolution STEM imaging performance. The Spectra Ultra S/TEM is equipped with the new S-TWIN' (S-TWIN Prime) pole piece. The S-TWIN' is based on the S-TWIN design. It provides both ultra-high spatial resolution in STEM (e.g., 50 pm at 300 kV and 96 pm at 60 kV) and a wide gap for experiments requiring large tilt angles or bulky in situ ...
Spectra 300 S/TEM for Semiconductors - Thermo Fisher Scientific
Ideally suited for the semiconductor lab environment, the Thermo Scientific™ Spectra 300 S/TEM combines enhanced resolution, high-throughput and fast EDS mapping with no loss in spatial resolution.
The Thermo ScientificTM Spectra 300 S/TEM combines: Redesigned, high-stability base. New ultra-high resolution (X-FEG UltiMono) source or a ultra-high brightness (X-CFEG) source. Image and 5th order probe aberration correction (S-CORR) Single electron sensitive STEM detection.
Spectra 300 (S)TEM | UMF - The Hong Kong Polytechnic …
The Spectra 300 (S)TEM is the highest resolution imaging and spectroscopic platform. By synchronizing new ultra-high resolution (X-FEG UltiMono source, Image and 5th order probe aberration correction, single electron sensitive STEM detection, wide-gap pole piece and sensitive energy dispersive X-ray (EDX) detectors through advanced software and ...
Thermo Fisher Spectra 300 STEM 30-300kV (Andromeda)
The Thermo Fisher Spectra 300 STEM (Andromeda) is a high resolution aberration corrected scanning transmission electron microscope that will enable the study of magnetic materials at atomic resolutions at the CCMR.
Spectra 300 (S)TEM for materials science - DirectIndustry
The redesigned enclosure and ultra-stable Spectra 300 (S)TEM base with passive and (optional) active vibration isolation (with iVIS) minimize external environmental influences and ensure high-quality data from long-term and short-term experiments.
Spectra 300 S/TEM for Semiconductors - 赛默飞世尔科技公司
Semiconductor failure analysis and semiconductor manufacturing research with S/TEM, done quickly and reliably. Features improved ease of use and X-FEG.
TEM microscope Spectra 300 - DirectIndustry
Thermo Fisher Scientific introduces the Thermo Scientific Spectra 300 (S)TEM – the highest resolution, aberration corrected, scanning transmission electron microscope for all materials science applications.
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